Materials science, spectroscopy & electron microscopy measurements

We offer special measurement services for materials science, spectroscopy & electron microscopy to you at our premises. You are welcome to use our state-of-the-art application lab for your measurements or benefit from the many years of experience we have in the above fields and let us do the measurements for you.

We offer the following measurements:

  • 60 MHz NMR Spectroscopy (1H & 19F)
  • Adhesive strength and friction resistance of films and surfaces
  • Micro and nano hardness and E-modulus of thin films and surfaces
  • Molecular interactions on surfaces
  • Optical constants and thicknesses of thin film systems by spectroscopic ellipsometry
  • Particle sizing
  • Surface characterization of nanostructures on hard and soft biological samples
  • Surface and element characterization by electron microscopy
  • Viscoelastic properties of thin films

Available measurement systems:

  • Nanohardness tester: MicroMaterials NanoTest Vantage
  • NMR Spectroscopy: Pulsar 60 MHz NMR Spektroscope (1H &  19F)
  • Phenom Pro X Desktop Electronmicroscope
  • QCM-D: Q-Sense E4
  • Spectroscopic ellipsometry: J. A. Woollam M-2000, VASE, Alpha-SE

Contact

Wilfried Helle
Application Scientist - Measurement Services
+49 6151 8806-33
Fax: +49 6151 8806933
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European offices
© LOT Quantum Design 2016