Premium accurate AFM imaging and scan microscopy

NX10 from Park Systems

Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. With more time and better data, you can focus on doing more innovative research.

Features
2D flexure-guided XY Scanner with 50 μm x 50 μm scan range
High speed Z scanner with 15 μm scan range
Fast automatic tip approach
Low noise XYZ position sensors
Accessible sample holder

Better accuracy means better productivity
From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. The user friendly interface, easy laser alignment, automatic tip approach, and analysis software allow you to get publishable results faster.


Better accuracy means better research
With more time and better data, you can focus on doing more innovative research. And the Park NX10’s wide range of measurement modes and customizable design means it can be easily tailored to the most unique projects.

 

 

Surface roughness
Solar cells
Electricial characterization
Mechanical characterization
Follow us: twitter linkedin
European offices
© LOT Quantum Design 2016