TEM orientation imaging

ASTAR from Nanomegas

ASTAR can turn any transmission electron microscope (TEM) into a very powerful analytical tool enabling orientation–phase imaging at 1 nm resolution attainable (field-emission gun TEM) in combination with other TEM analytical techniques.
The device uses TEM based orientation mapping technique (electron backscatter diffraction -TEM like) based on collection of precession electron diffraction (PED) patterns and cross-correlation comparison with simulated intensities.

Features
Works with any TEM 120-200-300 KV (LaB6/FEG)
Orientation-phase map 1 nm resolution attainable with TEM-FEG
Works in combination with precession diffraction device DigiSTAR for ultra-precise orientation/phase maps
ASTAR works with any type of diffracting material (inorganic, organic) using standard TEM specimen preparation techniques
Retrofit between multiple TEMs in same lab

Contacts

Request further information
Technical Director
+44 1372 378822
Fax: +44 1372 375353

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